Manual probe system with needles for test of semiconductor on silicon wafer. Selective focus.

RFID:2B39AK3

Image details

Contributor:

Anatoly Morozov / Alamy Stock Photo

Image ID:

2B39AK3

File size:

28 MB (512.8 KB Compressed download)

Releases:

Model - no | Property - noDo I need a release?

Dimensions:

3832 x 2555 px | 32.4 x 21.6 cm | 12.8 x 8.5 inches | 300dpi

Date taken:

12 December 2019

More information:

Checking microchips on silicon wafer with probe station.Close up . Semiconductor Crystal Manufacturing.Selective focus.

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