Silicon microscope hi-res stock photography and images

Bausch & Lomb Microzoom compound microscope, used extensively in the semi conductor industry for silicon wafer inspection. Stock Photo

RMH6CW2M–Bausch & Lomb Microzoom compound microscope, used extensively in the semi conductor industry for silicon wafer inspection.

Silicon atoms of a silicon chip imaged with a scanning tunneling microscope Stock Photo

RFB714HT–Silicon atoms of a silicon chip imaged with a scanning tunneling microscope

Semiconductor Silicon Wafer Probe testing process. 3D rendering image. Stock Photo

RF2X3CEG9–Semiconductor Silicon Wafer Probe testing process. 3D rendering image.

Atomic Force microscope cantalever scanning over patterned silicon micro electronic thin film devices at high magnification Stock Photo

RMA47FKY–Atomic Force microscope cantalever scanning over patterned silicon micro electronic thin film devices at high magnification

Semiconductor silicon wafer defect inspection. Automated optical inspection equipment for semiconductor silicon wafer defects detection. Selective foc Stock Photo

RF2WB1TC8–Semiconductor silicon wafer defect inspection. Automated optical inspection equipment for semiconductor silicon wafer defects detection. Selective foc

SEM image of SiO2 Silicon Dioxide empty balls, coated with gold and imaged in scanning electron microscope Stock Photo

RFE0AC9M–SEM image of SiO2 Silicon Dioxide empty balls, coated with gold and imaged in scanning electron microscope

Semiconductor silicon wafer under test on the probe station. Selective focus. Stock Photo

RF2FMRPH5–Semiconductor silicon wafer under test on the probe station. Selective focus.

surface of a microchip, Differential interference contrast picture, silicon wafer Stock Photo

RM2AYFRR8–surface of a microchip, Differential interference contrast picture, silicon wafer

Extreme magnification - Camera sensor under the microscope Stock Photo

RFR6FJA5–Extreme magnification - Camera sensor under the microscope

silicone wafer under the microscope Stock Photo

RF2T8D5DX–silicone wafer under the microscope

Illustration of a new technique to eke more power out of solar cells. Owing to physical limits, the maximum amount of sunlight falling on a solar cell that can be converted to electricity is only 34 percent. However, researchers at Warwick University in the UK have demonstrated how this might be overcome, boosting the efficiency of solar cell materials. They pressed the conductive tip of an atomic force microscope into the material, which squeezed and deformed individual crystals of strontium titanate (SrTiO3), titanium dioxide (TiO2), and silicon (Si). Stock Photo

RFMNN37R–Illustration of a new technique to eke more power out of solar cells. Owing to physical limits, the maximum amount of sunlight falling on a solar cell that can be converted to electricity is only 34 percent. However, researchers at Warwick University in the UK have demonstrated how this might be overcome, boosting the efficiency of solar cell materials. They pressed the conductive tip of an atomic force microscope into the material, which squeezed and deformed individual crystals of strontium titanate (SrTiO3), titanium dioxide (TiO2), and silicon (Si).

Engineer putting wafer chip on microscope in laboratory Stock Photo

RF2PGP16G–Engineer putting wafer chip on microscope in laboratory

Nanostructures on silicon. Coloured scanning electron micrograph (SEM) of nanostructures formed on a silicon surface by a laser beam. This research involves the use of lasers to etch and ablate metal and semiconductor surfaces. The resulting nanostructure Stock Photo

RFJ4JPJF–Nanostructures on silicon. Coloured scanning electron micrograph (SEM) of nanostructures formed on a silicon surface by a laser beam. This research involves the use of lasers to etch and ablate metal and semiconductor surfaces. The resulting nanostructure

Silicon wafer on machine process examining in microscope. Stock Photo

RF2B395DC–Silicon wafer on machine process examining in microscope.

Dr Neil Fox with images showing three levels of magnification of atoms on a sample of silicon produced from a scanning probe mic Stock Photo

RMDETNBJ–Dr Neil Fox with images showing three levels of magnification of atoms on a sample of silicon produced from a scanning probe mic

Inspection of the quality of silicon chips in the laboratory with a microscope Stock Photo

RFRDCWXY–Inspection of the quality of silicon chips in the laboratory with a microscope

close up of an Intel Pentium microprocessor silicon chip Stock Photo

RMB3RYWK–close up of an Intel Pentium microprocessor silicon chip

Effects of polarization on crystallization of chmemical substaces as show under the microscope Stock Photo

RF2RD5RDK–Effects of polarization on crystallization of chmemical substaces as show under the microscope

Itzehoe, Germany. 04th Apr, 2023. An employee in the production of wafers works under yellow light at a microscope for quality control in the clean room of the semiconductor company Vishay Siliconix Itzehoe GmbH. Wafers are silicon wafers that serve as carriers for the production of microchips. Credit: Christian Charisius/dpa/Alamy Live News Stock Photo

RM2PNG4T9–Itzehoe, Germany. 04th Apr, 2023. An employee in the production of wafers works under yellow light at a microscope for quality control in the clean room of the semiconductor company Vishay Siliconix Itzehoe GmbH. Wafers are silicon wafers that serve as carriers for the production of microchips. Credit: Christian Charisius/dpa/Alamy Live News

RMH6CW30–Bausch & Lomb Microzoom compound microscope, used extensively in the semi conductor industry for silicon wafer inspection.

Professional medical microscope in science lab, exhibition Stock Photo

RF2K0Y91A–Professional medical microscope in science lab, exhibition

Clay rendering of Semiconductor Silicon Wafer Probe testing process. 3D rendering image. Stock Photo

RF2X3CEHT–Clay rendering of Semiconductor Silicon Wafer Probe testing process. 3D rendering image.

Atomic Force microscope cantalever scanning over patterned silicon micro electronic thin film devices at high magnification, UK Stock Photo

RMA47FMJ–Atomic Force microscope cantalever scanning over patterned silicon micro electronic thin film devices at high magnification, UK

Close-up of the Engineer/ Technician/ Scientist Checking Component under the Microscope. He Wears Sterile Coverall Suit and Protective Glasses Stock Photo

RFM79DC3–Close-up of the Engineer/ Technician/ Scientist Checking Component under the Microscope. He Wears Sterile Coverall Suit and Protective Glasses

RF2TBN1HY–silicone wafer under the microscope

Silicon semiconductor wafer on RF probe station. Selective focus. Stock Photo

RF2FNRK68–Silicon semiconductor wafer on RF probe station. Selective focus.

RM2AYR3MF–surface of a microchip, Differential interference contrast picture, silicon wafer

RFR6FJ9T–Extreme magnification - Camera sensor under the microscope

RM2AYM9F1–surface of a microchip, Differential interference contrast picture, silicon wafer

Manual probe system for RF test of semiconductor silicon wafers. Selective focus. Stock Photo

RFW3E9D5–Manual probe system for RF test of semiconductor silicon wafers. Selective focus.

RM2B05DRT–surface of a microchip, Differential interference contrast picture, silicon wafer

Engineer checking silicon wafer chip using semiconductor in laboratory Stock Photo

RF2PGP16R–Engineer checking silicon wafer chip using semiconductor in laboratory

RFJ4JPJY–Nanostructures on silicon. Coloured scanning electron micrograph (SEM) of nanostructures formed on a silicon surface by a laser beam. This research involves the use of lasers to etch and ablate metal and semiconductor surfaces. The resulting nanostructure

RF2B395D5–Silicon wafer on machine process examining in microscope.

RMDETNB9–Dr Neil Fox with images showing three levels of magnification of atoms on a sample of silicon produced from a scanning probe mic

RFRHPNT5–Inspection of the quality of silicon chips in the laboratory with a microscope

RMB3T0CY–close up of an Intel Pentium microprocessor silicon chip

RF2RD5REJ–Effects of polarization on crystallization of chmemical substaces as show under the microscope

RMH6CW2T–Bausch & Lomb Microzoom compound microscope, used extensively in the semi conductor industry for silicon wafer inspection.

RM2PNG4T6–Itzehoe, Germany. 04th Apr, 2023. An employee in the production of wafers works under yellow light at a microscope for quality control in the clean room of the semiconductor company Vishay Siliconix Itzehoe GmbH. Wafers are silicon wafers that serve as carriers for the production of microchips. Credit: Christian Charisius/dpa/Alamy Live News

Sand with Cassiterite & Columbite, polarized photomicrograph Stock Photo

RMH9A636–Sand with Cassiterite & Columbite, polarized photomicrograph

Composite of image showing cantalever scanning thin film devices while using Atomic Force microscope at high resolution Stock Photo

RMA47FKT–Composite of image showing cantalever scanning thin film devices while using Atomic Force microscope at high resolution

RF2K6X5DP–Professional medical microscope in science lab, exhibition

Electronics Factory Worker in White Work Coat Inspects a Printed Circuit Board Through a Digital Microscope. High Tech Factory Facility. Stock Photo

RF2D6K761–Electronics Factory Worker in White Work Coat Inspects a Printed Circuit Board Through a Digital Microscope. High Tech Factory Facility.

RF2T8D5E5–silicone wafer under the microscope

Technician examining chip, using microscope to run diagnosis and upgrade device Stock Photo

RF2AMY551–Technician examining chip, using microscope to run diagnosis and upgrade device

RFR6FJ9K–Extreme magnification - Camera sensor under the microscope

RF2WG3YFM–Microcones on silicon, SEM

Semiconductor silicon wafer undergoing probe testing. Selective focus. Stock Photo

RFKM71G6–Semiconductor silicon wafer undergoing probe testing. Selective focus.

RM2AYYJ3E–surface of a microchip, Differential interference contrast picture, silicon wafer

Silicon on the periodic table of elements Stock Photo

RF2C49AW9–Silicon on the periodic table of elements

Drops from a pipette. Liquid gel or serum on a microscope screen on a white background Stock Photo

RF2H0KMWT–Drops from a pipette. Liquid gel or serum on a microscope screen on a white background

RF2B395PY–Silicon wafer on machine process examining in microscope.

RMDETNB3–Dr Neil Fox with images showing three levels of magnification of atoms on a sample of silicon produced from a scanning probe mic

Checking microchips on silicon wafer with probe station and microscope.Microelecronics. Stock Photo

RF2B38Y72–Checking microchips on silicon wafer with probe station and microscope.Microelecronics.

RFRG30WH–Inspection of the quality of silicon chips in the laboratory with a microscope

RF2B395DF–Silicon wafer on machine process examining in microscope.

silicon crystal with photovoltaic cells in the hand of the scientist Stock Photo

RFEGT5NG–silicon crystal with photovoltaic cells in the hand of the scientist

RM2PNG449–Itzehoe, Germany. 04th Apr, 2023. An employee in the production of wafers works under yellow light at a microscope for quality control in the clean room of the semiconductor company Vishay Siliconix Itzehoe GmbH. Wafers are silicon wafers that serve as carriers for the production of microchips. Credit: Christian Charisius/dpa/Alamy Live News

RMH9A632–Sand with Cassiterite & Columbite, polarized photomicrograph

Dresden, Germany. 19th Jan, 2024. A wafer from the X-FAB Group lies under a microscope at the 'KarriereStart' job fair. Credit: Sebastian Kahnert/dpa/Alamy Live News Stock Photo

RM2WENJ68–Dresden, Germany. 19th Jan, 2024. A wafer from the X-FAB Group lies under a microscope at the 'KarriereStart' job fair. Credit: Sebastian Kahnert/dpa/Alamy Live News

RF2RD5R3X–Effects of polarization on crystallization of chmemical substaces as show under the microscope

Electronics Factory Worker in White Work Coat is Soldering a Printed Circuit Board Through a Digital Microscope. High Tech Factory Facility. Stock Photo

RF2D6K764–Electronics Factory Worker in White Work Coat is Soldering a Printed Circuit Board Through a Digital Microscope. High Tech Factory Facility.

RF2T8D4CF–silicone wafer under the microscope

Silica gel for moisture control, absorbent particles under a light microscope, magnification 40 times Stock Photo

RF2HE044C–Silica gel for moisture control, absorbent particles under a light microscope, magnification 40 times

RFR6FJ9M–Extreme magnification - Camera sensor under the microscope

Microphotograph of internal wiring and die of Texas Instruments TMS 2532A-45JL UV eprom. Taken through a 10x standard microscope objective. SEE NOTES Stock Photo

RM2GD54Y3–Microphotograph of internal wiring and die of Texas Instruments TMS 2532A-45JL UV eprom. Taken through a 10x standard microscope objective. SEE NOTES

Engineer sitting in robot fabrication room use measuring microscope machine check microchip Stock Photo

RF2M85GAT–Engineer sitting in robot fabrication room use measuring microscope machine check microchip

RM2B05DKD–surface of a microchip, Differential interference contrast picture, silicon wafer

manufacture of chips on a printed circuit board under a microscope Stock Photo

RFR8H0BF–manufacture of chips on a printed circuit board under a microscope

RF2H3F50X–Drops from a pipette. Liquid gel or serum on a microscope screen on a white background

Close up of examining of test sample of microchip transistor under the microscope in laboratory. Equipment for testing microchips. Automation of produ Stock Photo

RF2RH3B61–Close up of examining of test sample of microchip transistor under the microscope in laboratory. Equipment for testing microchips. Automation of produ

Technician in a clean room environment using a microscope to inspect computer semi conductors Stock Photo

RMC12BYK–Technician in a clean room environment using a microscope to inspect computer semi conductors

RF2F902GT–Close up of examining of test sample of microchip transistor under the microscope in laboratory. Equipment for testing microchips. Automation of produ

RFB71199–Silicon atoms of a silicon chip imaged with a scanning tunneling microscope

RF2B395RB–Silicon wafer on machine process examining in microscope.

RFGF845P–silicon crystal with photovoltaic cells in the hand of the scientist

RMHRJKC0–Silicon Solar Cell, LM

RMH9A63D–Sand with Cassiterite & Columbite, polarized photomicrograph

RFRADAWD–Inspection of the quality of silicon chips in the laboratory with a microscope

RF2RD5R0E–Effects of polarization on crystallization of chmemical substaces as show under the microscope

RF2D6K78P–Electronics Factory Worker in White Work Coat is Soldering a Printed Circuit Board Through a Digital Microscope. High Tech Factory Facility.

RF2T8D3P7–silicone wafer under the microscope

RF2HD4PJ6–Silica gel for moisture control, absorbent particles under a light microscope, magnification 40 times

RFR6FJA4–Extreme magnification - Camera sensor under the microscope

silicone wafer under the microscope,integrated circuits to manufacture CPU and GPU Stock Photo

RF2TBN1AM–silicone wafer under the microscope,integrated circuits to manufacture CPU and GPU

RM2GD552F–Microphotograph of internal wiring and die of Texas Instruments TMS 2532A-45JL UV eprom. Taken through a 10x standard microscope objective. SEE NOTES

RM2AYM9R7–surface of a microchip, Differential interference contrast picture, silicon wafer

RF2M85FWH–Engineer sitting in robot fabrication room use measuring microscope machine check microchip

RF2H25KGM–Drops from a pipette. Liquid gel or serum on a microscope screen on a white background

Industry Manufacturing Electronics Technician working with microscope Silicon wafer Concept Stock Photo

RMA8W1AG–Industry Manufacturing Electronics Technician working with microscope Silicon wafer Concept

Ispra (Italy), JRC, Joint European Research Center, Institute for the Atmosphere and the sustainability Stock Photo

RME7BD23–Ispra (Italy), JRC, Joint European Research Center, Institute for the Atmosphere and the sustainability

RF2F9GPKG–Close up of examining of test sample of microchip transistor under the microscope in laboratory. Equipment for testing microchips. Automation of produ

Silicon (Si 14) pure crystalline form. Specimen from . Micro photography extreme close-up. microscope mineral crystal photography for Scientific use. Stock Photo

RF2YK63PX–Silicon (Si 14) pure crystalline form. Specimen from . Micro photography extreme close-up. microscope mineral crystal photography for Scientific use.

RF2B395R5–Silicon wafer on machine process examining in microscope.

Chip testing equipment. Manufacturing of microchips. A close-up study of a test sample of a transistor chip under a microscope in the laboratory. Auto Stock Photo

RF2JF1M3J–Chip testing equipment. Manufacturing of microchips. A close-up study of a test sample of a transistor chip under a microscope in the laboratory. Auto